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July 30, 2008

Teradyne's First CMOS Image Sensor, Launched by Hynix Semiconductor

By Calvin Azuri, TMCnet Contributing Editor

Teradyne (News - Alert) Inc. has announced the launch of their first CMOS image sensor, using the new Teradyne IP750Ex test system for wafer testing. Hynix Semiconductor, Inc., Icheon-si, Kyoungki-do Korea, will be launching this sensor.



 
With more than 2,800 systems installed world over, the IP750Ex is an extension of Teradyne’s successful J750 platform. Specifically designed for image sensor test, not only can it be easily upgraded from its predecessor IP750 and IP750EP (EMP) systems, but also from the J750. It is one of the most versatile testers available. They have more than 730 testers installed worldwide.
 
The IP750Ex is being used by many customers for their production needs. It helps achieve a lower cost-of-test with higher parallel testing. It also improves the total test time capability. It can cover complex next generation devices that work at speeds as high as 200MHz and up to 32M pixels.
 
To ensure that customers get the lowest cost of test per site, the company has designed the image sensor test system to accommodate a dual core CPU and per site DSP architecture.
 
It provides a parallel test 32 sites that have a centralized architecture with Infiniband data transfer for higher throughput, SOC testing capability, and an analog option for CCD or DSLR testing.
 
Hirofumi Adachi, product manager, Teradyne said, “It’s exciting to launch the IP750Ex with such clear differentiators that make a real difference on the test floor. Using the J750 test head, IP750Ex provides a small footprint, yet it delivers powerful technical and performance advantages that will serve test needs now and well into the future.”
 
A low test cost, superior performance, and high output sums up the IP750 series. The device has a very broad coverage of up to 32M Pixels, for low- to high-speed CCD and CMOS sensors, analog and digital capture. It comes with an internal illuminator and external illuminators from major illuminator suppliers, all integrated into the system.
 
Headquartered in North Reading, Mass, Teradyne is a supplier of Automatic Test Equipment. This equipment is used to test complex electronics. They deliver competitive advantage to the world's leading semiconductor, electronics and automotive companies. They cater to the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries.
 
Calvin Azuri is a contributing editor for TMCnet. To read more of Calvin’s articles, please visit his columnist page.
 







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