TMCnet News
Research and Markets: InvenSense MP67B - Reverse Costing AnalysisResearch and Markets (http://www.researchandmarkets.com/research/6sj6lq/_invensense_mp67b) has announced the addition of the " InvenSense MP67B - Reverse Costing Analysis" report to their offering. With 74.5 million units of iPhone sold during the last quarter 2014, InvenSense made a very good deal by replacing STMicroelectronics (News - Alert) as the supplier of the gyroscope for the iPhone 6 and 6 Plus. The MP67B is a custom version of InvenSense 6-Axis device (3-Axis gyroscope + 3-Axis accelerometer) made for Apple (News - Alert). Compared to InvenSense's standard 6-Axis device MPU-6500, specific modifications have been realized. The main ones consist in the package modification with the use of a LGA substrate compared to a QFN leadframe, and in the ASIC which has been redesigned. The MP67B uses the same process as InvenSense's second generation 6-axis device with a new design of the 3-axis gyroscope which now uses a single structure vibratory compared to three different structures for the previous generation of gyros. This new design results in a shrink of 40% of the 3-axis gyro area. The second benefit of this new design is that Nasiri process has been changd: cavities which were traditionally etched in the ASIC to allow MEMS structures moving are no longer used, thus resulting in cost reduction. Key Topics Covered: 1. Overview / Introduction - Executive Summary - Reverse Costing Methodology 2. Company Profile - InvenSense Profile - iPhone (News - Alert) 6 Teardown 3. Physical Analysis - Synthesis of the Physical Analysis - Physical Analysis Methodology Package - Package View & Dimensions - Package Opening - Package Cross-Section Die - View, Dimensions & Marking - MEMS Removed - MEMS Sensing Area: Gyroscope - MEMS Sensing Area: X/Y-Axis (News - Alert) Accelerometer - MEMS Sensing Area: Z-Axis Accelerometer - MEMS Cap- ASIC Delayering & Process - Die Cross-Section: ASIC - Die Cross-Section: MEMS (Pads Opening) - Die Cross-Section: MEMS (Sealing) - Die Cross-Section: Sensor (Electrical Contacts) - Die Cross-Section: Sensor (Standoffs) - Die Cross-Section: Sensor (Al-GE Bonding) - Die Cross-Section: Sensor (Mobile Elements) - Die Cross-Section: Cap - Comparison with MPU-6 - Comparison with previous generation 5. Manufacturing Process Flow - Global Overview - ASIC Front-End Process - MEMS Process Flow - Wafer Fabrication Unit - Packaging Process Flow - Package Assembly Unit 6. Cost Analysis - Synthesis of the cost analysis- Main steps of economic analysis - Yields Hypotheses - ASIC Front-End Cost - MEMS Front-End Cost - ASIC/MEMS Assembly Cost - MEMS Front-End Cost per process steps - Total Front-end Cost - Back-End : Probe Test & Dicing - Wafer & Die Cost - Back-End : Packaging Cost - Back-End : Packaging Cost per Process Steps - Back-End : Final Test & Calibration Cost - Component Cost 7. Estimated Price Analysis - InvenSense Financial Ratios - Component Estimated Price For more information visit http://www.researchandmarkets.com/research/6sj6lq/_invensense_mp67b
|