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Mesuro Delivers Measurements You Need from Non-linear Devices(M2 PressWIRE Via Acquire Media NewsEdge) Cardiff -- Mesuro, which offers testing and services solutions for the semiconductor industry, has announced its capability to deliver whatever measurements you need from your non-linear devices.Whatever measurement set or application is needed from your non-linear device data, Mesuro's measurement services can deliver. Their laboratory allows for device testing upto 100W CW packaged devices to 6GHz Fundamental; upto 20W CW packaged devices at X band; Fundamental test up to 67GHz; and fixture design and manufacture. Device Characterization allows customers to evaluate their device performance utilizing Mesuro's test platforms for immediate use within designs and to gain experience of the WaveForm Engineering process that can aid in business case justification and provide confidence through verified data sets. All parameters available in the test platforms can be measured, including DCIV, S-Parameters, Pin/Pout, Power and Efficiency Contours. With device modeling, non-linear measurement data has been exploited in various ways to create behavioral models for high frequency transistors. These include frequency-domain descriptive behavioral models, including Poly Harmonic Distortion (PHD) Models, S-functions and X-ParametersTM. Formulations of these models have been developed in the traveling wave domain with a desire to represent non-linear behavior of high frequency transistors. Work demonstrated using the Cardiff Model formulations, based on PHD models, has shown that by considering higher order mixing terms in the PHD formulation, a better fit can be achieved around a more compact file size, without sacrificing accuracy. When considering the performance of RF Power Amplifiers (PAs) or indeed other non-linear devices, it is the terminal RF I-V Waveforms that are the unifying theoretical link between transistor technology, circuit design, and system performance. From a non-linear PA design perspective, the integration of RF WaveForm Engineering capability, whether passive or active, with RF Waveform measurement capability, is essential. With such systems, the practical design of PAs achieved by directly employing the theoretically-based WaveForm Engineering approach is now experimentally possible. About Mesuro Headquartered in Pencoed, Nr Cardiff, UK, Mesuro focuses on commercialising RF test and measurement technologies resulting from Cardiff University's world-renowned Centre for High Frequency Engineering. Mesuro's measurement solutions overcome many of the limitations inherent in traditional design and testing processes by providing complete information and control of high frequency signals of the circuits under test. This allows for the development of an integrated development process that streamlines the development and testing cycle and reduces time to market. In addition to offering turnkey active load pull solutions, Mesuro also offers a wide range of testing services. For more information, visit: www.mesuro.com Issued on behalf of: Mesuro Ltd Pencoed Technology Park Pencoed Nr Cardiff CF35 5HZ Contact: Simon Mathias Email: [email protected] Tel: +44 (0) 7535 476 125 Website : www.mesuro.com More information from: JDK Marketing Communications 2 Betsoms Farm Pilgrims Way Westerham Kent, TN16 2DS Contact: John Kearley Email: [email protected] Tel: +44 (0) 1959 562 772 Website: www.jdk.co.uk ((M2 Communications disclaims all liability for information provided within M2 PressWIRE. Data supplied by named party/parties. Further information on M2 PressWIRE can be obtained at http://www.presswire.com on the world wide web. Inquiries to [email protected])). (c) 2013 M2 COMMUNICATIONS |