[April 23, 2013] OptimalTest Assigned Patent Tweet (Targeted News Service Via Acquire Media NewsEdge) By Targeted News Service ALEXANDRIA, Va., April 23 - OptimalTest, Ness Ziona, Israel, has been assigned a patent (8,421,494) developed by Gil Balog, Jerusalem, Reed Linde, El Dorado Hills, Calif., and Avi Golan, Tel Aviv, Israel, for "systems and methods for test time outlier detection and correction in integrated circuit testing." The abstract of the patent published by the U.S. Patent and Trademark Office states: "Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner." The patent application was filed on May 23, 2011 (13/113,409). The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=8,421,494.PN.&OS=PN/8,421,494&RS=PN/8,421,494 Written by Kusum Sangma; edited by Anand Kumar. KS0423AK0423-868866 (c) 2013 Targeted News Service [ Back To TMCnet.com's Homepage ]