[November 19, 2009] LTX-Credence Announces New High Precision Data Converter Test Module for X-Series Test Platform Tweet (FinancialWire.net Via Acquire Media NewsEdge) (Comment on this article at http://www.financialwire.net/2009/11/19/ltx-credence-announces-new-high-precision-data-converter-test-module-for-x-series-test-platform/) November 19, 2009 (FinancialWire) -- LTX-Credence Corp. (NASDAQ: LTXC), a provider of innovative semiconductor ATE solutions, announced a new multi-channel, high precision AC and DC instrument for the X-Series test platform. Each Data Converter Test Module contains 16 independent differential channels for high volume testing of precision analog devices. This level of integration delivers unprecedented capability for multi-site testing of devices in automated test equipment. DCTM's precision capability and instrument density lowers engineering expense, dramatically reduces test costs, and enhances product yields. In addition to data converters, the DCTM supports the testing of other high performance devices including audio amplifiers, temperature sensors and linear devices for both static and dynamic test. FinancialWire(tm) is a fully independent, proprietary news wire service. FinancialWire(tm) is not a press release service, and receives no compensation for its news, opinions or distributions. Further disclosure is at the FinancialWire(tm) web site (http://www.financialwire.net/disclosures.php). Contact FinancialWire(tm) directly via [email protected]. Free annual reports for companies mentioned in the news are available through the Free Annual Reports Service (http://investrend.ar.wilink.com/?level=279). ((Comments on this story may be sent to [email protected])) (c) 2009 M2 COMMUNICATIONS [ Back To TMCnet.com's Homepage ]