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Credence Helps Semiconductor Manufacturers Meet Rising Demand for Faster Data Rates With Sapphire D-6432DFT Test Solution
(Market Wire Via Thomson Dialog NewsEdge) MILPITAS, CA, July 16 / MARKETWIRE/ --
Marking a major enhancement to the company's
market-leading Sapphire test platform, Credence Systems (NASDAQ: CMOS)
today launched the industry's most cost-effective, highest-performing
solution for testing microprocessor, gaming, and graphics devices used in
emerging high-speed computing and consumer applications. The Sapphire
D-6432DFT instrument is the first integrated test solution for high-speed
serial buses to combine at-speed loopback testing with jitter measurement
and injection -- along with scan/functional tests and DC parametrics -- all
in a single insertion. The D-6432DFT delivers four times greater density
than comparative offerings, presenting manufacturers with a breakthrough
design-for-test (DFT) methodology that dramatically lowers overall cost and
time-to-market of high-speed semiconductor devices.
The new instrument was developed in partnership with microprocessor
pacesetter Advanced Micro Devices (AMD), whose engineers are leveraging the
Sapphire platform and the D-6432DFT to help accelerate the time-to-test and
time-to-market of their most advanced products. Over 200 D-6432DFT
instruments are being used in production, building upon the proven,
award-winning Sapphire platform with an installed base of hundreds of
testers worldwide.
"The increasing design challenges of high-speed bus interfaces together
with even faster data rates necessitates more robust testing than what is
possible with simple loadboard loopback techniques," stated Pete
Hodakievic, senior member of technical staff and manager of ATE technology
at AMD. "At the same time, the need to control the cost of test rules out
conventional instrument methods. The Sapphire D-6432DFT enables us to
perform high-speed loopback tests, DC parametric tests, and scan and
functional tests -- all in the same socketing -- on our most advanced
microprocessors. In addition to helping enable better test coverage
compared to full-functional test, the D-6432DFT delivers a very attractive
cost-of-test proposition."
High-speed interfaces such as PCI Express I and II, HyperTransport 2.0 and
3.0, XAUI, XDR, RapidIO and InfiniBand are increasingly being used to
deliver faster data rates. Faster buses, however, render traditional
"functional" testing methods ineffective in terms of cost, complexity, and
cycle times. While these uncertainties can be worked around at lower
speeds, compromising coverage above 6 Gbps is risky. Current "near end"
loopback (i.e., using the device to source the test data and receive it
back into the device for recognition) techniques are simple and cost
effective, but their inability to adequately address variables such as
jitter, signal variations, and protocol performance lead to incomplete
testing and test escapes. IC manufacturers need to leverage DFT
methodologies that enable flexible, comprehensive testing of key variables
impacting device and system performance.
Far-end Loopback: Delivering Higher Value via Unsurpassed Jitter
Measurement and Control
The Sapphire D-6432DFT effectively implements innovative far-end loopback
techniques combining the flexibility of DFT with the more in-depth
diagnostics of functional testing. Lengthening the feedback path by placing
the DUT in communication with an intelligent but still cost-effective
tester channel makes production-level testing of high-speed buses viable
for the first time. Unlike piecemeal approaches requiring investment in
multiple instruments to test a handful of lanes, the D-6432DFT integrates
extensive functionality and enables testing of up to 16 lanes on a single
instrument. Benefits include:
-- Simultaneous, parallel jitter injection and jitter measurement per
lane through integrated electronics, rather than additional instruments
-- Full eye closure testing in the voltage and time domain
-- Exceptional low-cost differential test, with integrated 400/800 Mbps
data subsystem for scan/functional test
-- Increased coverage in detecting sensitivity to signal integrity issues
-- Receiver and transmitter channels can be used to deliver test vectors
to the core logic and protocol stack
-- Access to device pins for full DC parametric testing
"Partnerships with industry leaders like AMD enable us to deliver solutions
to the marketplace that help our customers innovate with confidence and
meet the twin challenges of time-to-market and cost pressures," said Chetan
Desai, vice president and general manager of ATE products at Credence.
"With the Sapphire D-6432 DFT, we are pleased to introduce the only viable
solution for production testing of high-speed devices that not only meets
today's requirements, but is adaptable for multiple product generations."
The Sapphire D-6432DFT is available now. The Credence Technology Center
(Metreon, July 17-18) during Semicon West 2007 will showcase the new
D-6432DFT instrument, as well product demos and presentations of the
company's comprehensive suite of test solutions, including the
award-winning Sapphire and Diamond platforms.
About Credence
Credence Systems Corporation is a leading provider of debug,
characterization & ATE solutions for the global semiconductor industry.
With a commitment to applying innovative technology to lower the
cost-of-test, Credence delivers competitive cost & performance advantages
to integrated device manufacturers (IDMs), wafer foundries, outsource
assembly & test (OSAT) suppliers & fabless chip companies worldwide. A
global, ISO 9001-certified company with a presence in 20 countries,
Credence is headquartered in Milpitas, California. More information is
available at http://www.credence.com.
Company Contact:
Uma Subramaniam
Sr. Director, Corporate Communications
(408) 635-4889Email Contact
David Pinto
Sr. Marketing Communications Manager
(408) 635-4868Email Contact
Copyright 2007 Market Wire, Incorporated
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