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FormFactor Doubles the DRAM Test Capacity of Test Equipment With New
Wafer Probe Card Capability
LIVERMORE, CA, Nov 11, 2008 (MARKET WIRE via COMTEX) --
FormFactor, Inc. (NASDAQ: FORM) today introduced DC-Boost, an
advanced TRE(TM) test technology to increase probe test capacity. The
new wafer probe card capability enables more efficient use of tester
channels on test equipment to double the number of devices that can
be tested simultaneously. By using probe cards equipped with
FormFactor's DC-Boost technology, IC manufacturers and test service
providers can significantly increase test cell throughput on new test
equipment, extend the life of their existing test equipment, and
reduce their overall cost of test. Tera Probe, Inc., one of the
world's largest wafer test services providers, is one of several
customers adopting the new technology.
"At Tera Probe, our mission is to provide total testing solutions for
our customers that boast greater efficiency, lower costs and ensure
higher levels of reliability in order to help them meet their
production goals," stated Masahide Ozawa, chief technology officer at
Tera Probe, Inc. "FormFactor's DC-Boost capability supports that
mission by allowing us to utilize the latest in advanced wafer test
technology to enable more efficient, reliable testing of our
customers' product wafers."
As DRAM manufacturers move to tighter design configurations, the
number of die per wafer continues to rise, in some cases approaching
1500 die or more. At the same time, test managers are driving to
maximize the productivity of their test cells. "Reducing the number
of touchdowns in wafer testing is the primary driver for reducing
test costs," stated Stefan Zschiegner, senior vice president of the
DRAM product business unit at FormFactor. "Our DC-Boost test
technology brings a new degree of intelligence to our wafer probe
cards through the integration of application specific ICs -- enabling
FormFactor to take wafer test parallelism to the next level. With
this technology we can help our customers optimize their existing
equipment investment today and provide a clear roadmap for further
parallelism improvements on new device designs and tester platforms."
In addition to increasing the device under test, or DUT, capacity of
test equipment, DC-Boost minimizes drops in voltage that could lead
to over-testing or under-testing of devices. The new technology also
provides the ability to test devices in isolation to obtain precise
voltage measurements. As a result, customers can achieve a more
reliable test result, thereby improving yields.
FormFactor's DC-Boost solution is now being offered on the company's
PH150XP and Harmony XP(TM) probe cards for DRAM wafer testing.
Forward-Looking Statements
Statements in this press release that are not strictly historical in
nature are forward-looking statements within the meaning of the
federal securities laws, including results the company's customers'
might realize when using the company's products, demand for the
company's products and future growth. These forward-looking
statements are based on current information and expectations that are
inherently subject to change and involve a number of risks and
uncertainties. Actual events or results might differ materially from
those in any forward-looking statement due to various factors,
including, but not limited to: the company's ability to enable more
efficient use of tester channels on automated test equipment to
double the number of devices that can be tested simultaneously, to
enable IC manufacturers and test service providers to significantly
increase test cell throughput, increase probe test capacity, extend
the life of existing test equipment and reduce their overall cost of
test, to optimize existing equipment and provide for future roadmaps,
to minimize over-testing or under-testing of devices; and the ability
of the company's customers to achieve more reliable test results and
improve yields. Additional information concerning factors that could
cause actual events or results to differ materially from those in any
forward-looking statement is contained in the company's Form 10-K for
the fiscal year ended December 29, 2007 and the company's Form 10-Q
for the fiscal quarter ended June 28, 2008, filed with the Securities
and Exchange Commission ("SEC"), and subsequent SEC filings. Copies
of the company's SEC filings are available at
http://investors.formfactor.com/edgar.cfm. The company assumes no
obligation to update the information in this press release, to revise
any forward-looking statements or to update the reasons actual results
could differ materially from those anticipated in forward-looking
statements.
About FormFactor
Founded in 1993, FormFactor, Inc. (NASDAQ: FORM) is the leader in
advanced wafer probe cards, which are used by semiconductor
manufacturers to electrically test ICs. The company's wafer sort,
burn-in and device performance testing products move IC testing
upstream from post-packaging to the wafer level, enabling
semiconductor manufacturers to lower their overall production costs,
improve yields, and bring next-generation devices to market.
FormFactor is headquartered in Livermore, California with operations
in Europe, Asia and North America. For more information, visit the
company's web site at www.formfactor.com.
FormFactor, TRE, DC-Boost, Harmony and Harmony XP are trademarks or
registered trademarks of FormFactor, Inc.
Investor Contact:
Michael Magaro
Investor Relations
(925) 290-4949
Email Contact
Trade Press Contact:
David Viera
Director of Corporate Communications
(925) 290-4681
Email Contact
SOURCE: FormFactor
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