TMCnet News
Nullspace ES Supports First Experimental Demonstration of Standing-Wave EIT Cooling for Trapped IonsA Media Snippet accompanying this announcement is available by clicking on this link. HUNTSVILLE, Ala., Sept. 21, 2026 (GLOBE NEWSWIRE) -- Nullspace, a leading provider of advanced electromagnetic simulation software, today announced that researchers at Cornell University, led by Professor Karan Mehta, used Nullspace ES to support the first experimental demonstration of standing-wave electromagnetically-induced-transparency (EIT) cooling for trapped ions, building on theoretical predictions dating back to 1992. Using Nullspace ES to simulate the electrostatic fields of a complex chip-scale ion trap, researchers in Cornell University’s Mehta Group calculated the baseline voltage sets used to control ions throughout the experiment. The resulting experiment demonstrated a new approach to trapped-ion cooling that achieved higher cooling rates, addressed a broader range of modes, and reached lower final phonon occupation numbers than the conventional running-wave approach. Simulating the Electrostatics Behind Trapped-Ion Control Nullspace ES simulated the electrostatic fields generated by the Mehta Group’s chip surface electrodes, providing the baseline voltage calculations the researchers used for axial confinement, radial mode rotation, and sub-micron ion positioning. “As quantum hardware grows more complex, researchers are under pressure to iterate at a faster pace,” said Masha Petrova, CEO of Nullspace. “Cornell’s work demonstrates why simulation must advance alongside hardware, if not ahead of it. When ions need to be controlled at this level of precision within increasingly sophisticated systems, the simulation tools researchers rely on cannot become the bottleneck.” Building a Faster Path From Chip Design to Experimentation Nullspace ES enabled the group to combine high-fidelity simulation with the faster iteration required for this kind of research. The Mehta Group integrated Nullspace ES into its broader design workflow to create an automated pipeline from chip design to experimentally usable voltage sets. “Nullspace ES has proven highly valuable in allowing us to carry out accurate trap simulations efficiently, which is essential to effective design and simulation of devices at the precision important for these kinds of experiments,” said Cornell Professor Karan Mehta, principal investigator of the study. Enabling Faster, Broader Trapped-Ion Cooling About Nullspace Media Contact
|

