[May 17, 2017] |
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Optimal+ Presents and Exhibits Big Data Solutions at NIWeek 2017
Optimal+
CTO Michael Schuldenfrei will kick off NIWeek 2017 in the Tuesday, May
23 morning keynote and Big Data Acquisition Architect Michael Weir will
present a technical session, "Managing Big Data Acquisition to Improve
Product Manufacturing" on Wed., May 24 at 1 pm. In addition, Optimal+
will exhibit and offer demos of its award-winning big data analytics
solutions for the semiconductor and electronics industry at Booth #905.
Optimal+ is an NI Alliance Partner and will sponsor the Automotive Track
at the Thought Leadership Forum during NIWeek 2017.
WHAT:
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NI Week 2017 Keynote Address, Tuesday, May 23 at 8 am in AD1037
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-- Michael Schuldenfrei will join additional luminaries for the
NIWeek 2017 Keynote address and will discuss how new technologies
continue to converge on smart devices in the connected world. In
addition, Mr. Schuldenfrei will discuss how leading semiconductor
and wireless companies are leveraging the latest additions to the NI
platform, including Optimal+ big data analytics solutions, to
accelerate innovation and ensure high reliability and product
quality.
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"Managing Big Data Acquisition to Improve Product
Manufacturing" on Wed., May 24 at 1 pm in Room 1050
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-- Mike Weir will discuss the technical landscape of existing data
formats and their typical platform generation sources in both the
lab, factory and in the field, and introduce the concept of cross
company data harmonization and sharing through a common big data
infrastructure. The presentation will show how cross operational
data harmonization and big data analytics can be used to unlock
these previously unseen opportunities to measurably improve product
quality, yield and parametric performance.
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WHO:
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Optimal+ CTO Michael Schuldenfrei
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-- Optimal+
CTO Michael Schuldenfrei brings over 25 years of software and
information technology experience to the Optimal+ management team.
Before joining Optimal+ in 2005 as its CTO, Schuldenfrei was a
senior software architect at SAP, where he led the development of
Duet Software, a joint venture with Microsoft (News - Alert) to enable seamless
access to SAP data via Microsoft Office. Prior to joining SAP,
Schuldenfrei was a Software Architect at Microsoft, where he led
consulting engagements with the company's major customers. He was
also VP R&D, at ActionBase, a company providing
business-management enterprise solutions to enhance internal
organizational workflow and collaboration.
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Optimal+ Big Data Acquisition Architect Michael Weir
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-- Michael Weir is a deeply experienced automation professional and
leader delivering solutions for 20+ years. He has been involved in
all aspects from test station automation to organization build-out
of teams and enterprises. He has architected and developed tools
from reusable test modules to enterprise data management systems
delivering big data analytics tools to engineers. Michael is a
Certified LabVIEW Architect, TestStand Architect and professional
instructor. Michael gives back to the engineering community by being
a robotics mentor for First/FRC and by serving as an Adjunct
Professor at Florida Atlantic University, where he developed and
taught a LabVIEW course.
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WHEN:
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-- Michael Schuldenfrei Keynote Presentation, Tuesday, May 23 at 8
am in AD1037
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-- Managing Big Data Acquisition to Improve Product Manufacturing
Technical Session, May 24 at 1 pm in Room 1050
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WHERE:
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Austin Convention Center
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Austin, Texas
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Booth # 905
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About Optimal+
Optimal+
was founded in 2005 with the vision of uniting global manufacturing data
with human expertise to deliver actionable knowledge that enables
engineers to make better decisions, faster. Our Manufacturing
Intelligence™ Platform combines machine-learning algorithms with a
global data infrastructure to drive real-time product analytics that
extract hidden insights from the data silos of any semiconductor or
electronics supply chain. The company analyzes more than 50 billion
devices every year on behalf of Fortune 500 companies such as AMD (News - Alert),
NVIDIA, Qualcomm and ST Microelectronics to enhance quality and yield
and deliver comprehensive brand protection for all their products. For
more information, visit www.optimalplus.com.
Follow us on Twitter (News - Alert) @OptimalPlus.
View source version on businesswire.com: http://www.businesswire.com/news/home/20170517005653/en/
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