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Stress measurement setup for characterization of the deposited layer materials in semiconductor manufacturing process. [TendersInfo (India)]
[October 29, 2014]

Stress measurement setup for characterization of the deposited layer materials in semiconductor manufacturing process. [TendersInfo (India)]


(TendersInfo (India) Via Acquire Media NewsEdge) Prior Information Notice: Stress measurement setup for characterization of the deposited layer materials in semiconductor manufacturing process. This contract is divided into lots: no Major organization : FRAUNHOFER GESELLSCHAFT E.V.



Address : Hansastr. 27c 80686 München For the attention of: Frau Lönz Country :Germany Url : http://www.fraunhofer.de Address : Fraunhofer Gesellschaft e. V. über Vergabeportal deutsche-eVergabe Wilhelmstr. 20-22 65185 Wiesbaden GERMANY Tender notice number : 366323-2014 Notice type : Procurement Forecast Open date : 2015-10-28 Tender documents : T24465132.html (c) 2014 Euclid Infotech Pvt. Ltd. Provided by SyndiGate Media Inc. (Syndigate.info).

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