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Freescale Semiconductor Assigned Patent for Offset Error Automatic Calibration Integrated Circuit
[April 15, 2014]

Freescale Semiconductor Assigned Patent for Offset Error Automatic Calibration Integrated Circuit


(Targeted News Service Via Acquire Media NewsEdge) By Targeted News Service ALEXANDRIA, Va., April 15 -- Freescale Semiconductor, Austin, Texas, has been assigned a patent (8,689,604) developed by Peter S. Schultz, Gilbert, Ariz., and Sung-Jin Jo, Gilbert, Ariz., for an "offset error automatic calibration integrated circuit." The patent application was filed on Nov. 8, 2012 (13/671,951). The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=8,689,604.PN.&OS=PN/8,689,604&RS=PN/8,689,604 Written by Deviprasad Jena; edited by Jaya Anand.



DJ0415JA0415-1000367 (c) 2014 Targeted News Service

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