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Global Optical Patterned Wafer Inspection Equipment Market 2014-2018: Key Vendors, Market Drivers and Market Trends(M2 PressWIRE Via Acquire Media NewsEdge) Dublin - Research and Markets (http://www.researchandmarkets.com/research/cmw879/global_optical) has announced the addition of the "Global Optical Patterned Wafer Inspection Equipment Market 2014-2018" report to their offering. Optical patterned wafer inspection equipment is used to detect defects that occur during the semiconductor manufacturing processes. The increasing complexity of semiconductor manufacturing due to new design rules and processes has increased the density of defects in the semiconductor wafers. This in turn can ruin an entire wafer rather than just a die. Thus, optical patterned wafer inspection equipment is used by the semiconductor manufacturers to detect critical defects in semiconductor wafers. Optical patterned wafer inspection equipment helps the semiconductor manufacturers to effectively launch new products more quickly. This is mainly because they can introduce stringent inspection equipment such as optical patterned wafer inspection equipment in their manufacturing process to prevent any defects in the final product. The analysts forecast the Global Optical Patterned Wafer Inspection Equipment market to grow at a CAGR of 7.8 percent over the period 2013-2018. Key Regions - Americas (USA) - EMEA - APAC (Taiwan) Key Vendors - Applied Materials Inc. - KLA Tencor Corp. Other Prominent Vendors - ASML Holding N.V.Birst Inc. - Hitachi High-technologies Corp. - JEOL Ltd. - Tokyo Seimitsu Co. Ltd. - Toray Engineering Co. Ltd. Market Drivers - Increasing Demand for Integration and Miniaturization of Semiconductor Devices - For a full, detailed list, view our report. Market Challenges - Cyclical Nature of the Semiconductor Industry - For a full, detailed list, view our report. Market Trends - Rapid Technological Advancements - For a full, detailed list, view our report. Commenting on the report, an analyst from the team said: Rapid technological advancements such as transition from 300mm wafer to 450mm wafers, increasing adoption of FinFET architecture, emergence of 3D ICs, and introduction of 3D NAND architecture present a strong growth opportunity for optical patterned wafer inspection equipment. With the introduction of new technologies, the complexity of the semiconductor device also increases. This in turn paves the way for the use of inspection tools and equipment. Thus, it has become increasingly important for semiconductor inspection systems to ensure the reliability of semiconductors since semiconductors are expected to become more complex and advanced. This trend is expected to have a medium-term impact on the growth of the market over the next few years. For more information visit http://www.researchandmarkets.com/research/cmw879/global_optical About Research and Markets Research and Markets is the world's leading source for international market research reports and market data. We provide you with the latest data on international and regional markets, key industries, the top companies, new products and the latest trends. CONTACT: Research and Markets, Laura Wood, Senior Manager. [email protected] Fax from USA: 646-607-1907 Fax from rest of the world: +353-1-481-1716 Sector: Computing and Technology (http://www.researchandmarkets.com/categories.asp?cat_id=4&campaign_id=cmw879) . (c) 2014 M2 COMMUNICATIONS |