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New Issue of IBM Journal of Research and Development Focuses on IBM Enterprise System z196
PISCATAWAY, N.J., Feb. 14, 2012 /PRNewswire via COMTEX/ --
IEEE, the world's largest technical professional association, announced that the latest issue of IBM Journal of Research and Development has been published and appears exclusively in the IEEE Xplore® digital library. IBM Journal of Research and Development is the #1 most-cited journal in the category Computer Science, Hardware and Software, according to the 2010 Thomson Reuters Journal Citation Reports, released in June 2011.
This issue features 19 papers describing many of the new technologies that make the IBM Enterprise System z196 a unique mainframe computing platform. Topics include: The microprocessor, storage, input/output, packaging technologies, system design, firmware design and verification, advances in higher-availability computing, resource management, and some of the novel design methodology advances that have made these new technologies possible.
For more information or to learn how to subscribe, please visit www.ieee.org/go/ibmjournal.
About IBM Journal of Research and Development: IBM Journal of Research & Development was launched in 1957 by Thomas J. Watson Jr., IBM president and CEO, who viewed it as "a strong indication of the increasing emphasis we at IBM want to place in the future on fundamental science and technology." In 1962, the IBM Systems Journal was added to report advances in software, software systems and services, and today has merged with IBM Journal of Research & Development.
About IEEE: IEEE, the world's largest technical professional association, is dedicated to advancing technology for the benefit of humanity. Through its highly cited publications, conferences, technology standards, and professional and educational activities, IEEE is the trusted voice on a wide variety of areas ranging from aerospace systems, computers, and telecommunications to biomedical engineering, electric power, and consumer electronics. Learn more at http://www.ieee.org.
SOURCE IEEE
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